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HomeMIT 6.801 Machine Vision, Fall 2020Lecture 15: Alignment, PatMax, Distance Field, Filtering and Sub-Sampling (US 7,065,262)

Lecture 15: Alignment, PatMax, Distance Field, Filtering and Sub-Sampling (US 7,065,262)

1:24:08

Description: In this lecture, we discuss another patent on object inspection and pose estimation, known as PatMax. We look at computing distance to lines to perform better edge detection and the role of sparse convolution for multiscale systems that perform filtering.

Speaker: Berthold Horn