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HomeMIT 6.774 Physics of Microfabrication: Front End Processing, Fall 200411. Dopant Diffusion - Review Atomic Scale Models, Profile Measurement Techniques
MIT 6.774 Physics of Microfabrication: Front End Processing, Fall 2004

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11. Dopant Diffusion - Review Atomic Scale Models, Profile Measurement Techniques

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12. Ion Implantation and Annealing - Analytic Models and Monte Carlo

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11. Dopant Diffusion - Review Atomic Scale Models, Profile Measurement Techniques. Duration: 1:16:02.